ZEISS Microscopy Showcases New Interactive Display Wall at Microscopy and Microanalysis (M&M) 2022 Conference
ZEISS is installing a new interactive display wall that celebrates researchers' breakthroughs at M&M 2022, in Portland, OR, booth 1018, from July 31 to August 4. The wall features an interactive touch screen display that highlights multiple researchers from around the world and their breakthroughs in high visual detail.
The research presented on the interactive display at the ZEISS booth includes discoveries from Dr. Kaoru Sato, JFE Techno-Research Corporation, Japan, showcasing his use of SEM to examine high strength steel and surface modification; Dr James Schiffbauer, Associate Professor of Geology, University of Missouri, detailing the preservation pathway that allowed for capturing fine details in Ediacaran Period fossils; Dr. Mihaela Vlasea, Assistant Professor, Mechanical and Mechatronics Engineering, University of Waterloo, showing the possibility of using additive manufacturing to achieve highly intricate geometries and controlled microstructures, and additional breakthroughs in Life Sciences, Electronics, and Natural Resources as well.
ZEISS booth visitors are invited to celebrate researchers that move ideas into reality, through a sleek, ergonomic, and intuitive interface. When the visitors conclude their interaction, they can send the highlighted information directly to themselves or a colleague from the show floor.
In addition to the interactive wall, four customers will give presentations on the ZEISS booth, covering topics from "Freedom to Explore with the Focused Ion Beam Scanning Electron Microscope," delivered by Anna Steyer, Cryo Electron Tomography Specialist at European Molecular Biology Laboratory, to "Leveraging X-ray Microscopy Technology at the University of Michigan's (MC)2 Facility: Case Studies in Engineering," delivered by Dr. Nancy S. Muyanja, X-ray & Electron Microscopy Specialist at University of Michigan. More details can be found here: Booth Agenda
ZEISS is proud to be a partner in helping customers find their next breakthrough and is supporting them with these new innovations. To learn more and book a demo, please visit: ZEISS at Microscopy & Microanalysis (M&M) 2022
SOURCE ZEISS Research Microscopy Solutions
The research presented on the interactive display at the ZEISS booth includes discoveries from Dr. Kaoru Sato, JFE Techno-Research Corporation, Japan, showcasing his use of SEM to examine high strength steel and surface modification; Dr James Schiffbauer, Associate Professor of Geology, University of Missouri, detailing the preservation pathway that allowed for capturing fine details in Ediacaran Period fossils; Dr. Mihaela Vlasea, Assistant Professor, Mechanical and Mechatronics Engineering, University of Waterloo, showing the possibility of using additive manufacturing to achieve highly intricate geometries and controlled microstructures, and additional breakthroughs in Life Sciences, Electronics, and Natural Resources as well.
ZEISS booth visitors are invited to celebrate researchers that move ideas into reality, through a sleek, ergonomic, and intuitive interface. When the visitors conclude their interaction, they can send the highlighted information directly to themselves or a colleague from the show floor.
In addition to the interactive wall, four customers will give presentations on the ZEISS booth, covering topics from "Freedom to Explore with the Focused Ion Beam Scanning Electron Microscope," delivered by Anna Steyer, Cryo Electron Tomography Specialist at European Molecular Biology Laboratory, to "Leveraging X-ray Microscopy Technology at the University of Michigan's (MC)2 Facility: Case Studies in Engineering," delivered by Dr. Nancy S. Muyanja, X-ray & Electron Microscopy Specialist at University of Michigan. More details can be found here: Booth Agenda
ZEISS is proud to be a partner in helping customers find their next breakthrough and is supporting them with these new innovations. To learn more and book a demo, please visit: ZEISS at Microscopy & Microanalysis (M&M) 2022
SOURCE ZEISS Research Microscopy Solutions
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